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Multi-distance Far-Field and Near-Field HEDM Reference Dataset of Ti-7Al for Benchmarking 3D Crystallographic Reconstruction Algorithms
Hemant Sharma;
Jun-Sang Park;
Peter Kenesei
Wire-arc Additive Manufacturing Benchmark
Nicholas Bachus;
Amelia Henriksen;
Michael Hill;
Kyle Johnson;
Andrzej Nycz;
Chris Masuo;
William Carter;
Sougata Roy;
Srdjan Simunovic;
Xin Sun;
Brad Boyce