Detail

Optimizing Non-Rigid Registration for Scanning Transmission Electron Microscopy Image Series

Zhang, Chenyu; Feng, Jie; Yankovich, Andrew B.; Kvit, Alexander; Berkels, Benjamin; Voyles, Paul M.

Organizations

MDF Open

DOI

10.18126/1h93-n56i View on Datacite

Year

2020

Source Name

zhang_nrr_stem

Contact

Paul M. Voyles

Description

High-resolution Z-contrast / HAADF STEM image series on SrTiO_3 crystals as a function of pixel dwell time and number of images in the series. Used for testing precision after non-rigid registration and averaging. Data analysis codes and example Jupyter libraries included.