Detail

Edge and Interface Resistances Create Distinct Trade-Offs When Optimizing the Microstructure of Printed van der Waals Thin-Film Transistors

Zhu, Zhehao; Kim, Joon-Seok; Moody, Michael J.; Lauhon, Lincoln J.
simulation experiment semiconductors microscopy printed electronics thin-film transistors 2D materials transition metal dichalcogenides Kelvin probe force microscopy finite element simulation

Organizations

MDF Open

Year

2023

Source Name

zhu_transistor

Contacts

Zhehao Zhu (zhehaozhu2022@u.northwestern.edu) Lincoln Lauhon (lauhon@northwestern.edu)

DOI

10.18126/e9d0-pc68 View on Datacite

Get the Data

Raw experimental data, and Python notebooks for data analysis and device simulation.